US Patent 12063254 Parametric analysis of integrated operational and information technology systems

A system and method for analyzing integrated operational technology and information technology systems with sufficient granularity to predict key elements of their composite behavior. The system and method involve creating high-fidelity models of the operational technology and information technology systems using one or more cyber-physical graphs, performing parametric analyses of the models to identify key components, scaling the parametric analyses of the models to analyze the key components at a greater level of granularity, and iteratively improving the models via ongoing search and testing against observed data from the real-world systems.