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US Patent 11960799 Generating measurements of physical structures and environments through automated analysis of sensor data

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Contents

Is a
Patent
Patent
0

Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
119607990
Patent Inventor Names
Vu Tran0
Victor Palmer0
Brian Webb0
Brian Keller0
Date of Patent
April 16, 2024
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Patent Application Number
183072700
Date Filed
April 26, 2023
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Patent Citations
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US Patent 10033928 Apparatus and methods for rolling shutter compensation for multi-camera systems
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US Patent 10832437 Method and apparatus for assigning image location and direction to a floorplan diagram based on artificial intelligence
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US Patent 10937211 Automated parametrization of floor-plan sketches for multi-objective building optimization tasks
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US Patent 11006041 Multiple camera system for wide angle imaging
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US Patent 11043026 Systems and methods for processing 2D/3D data for structures of interest in a scene and wireframes generated therefrom
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US Patent 11094135 Automated measurement of interior spaces through guided modeling of dimensions
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US Patent 11200734 Method for reconstructing three-dimensional space scene based on photographing
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US Patent 11252329 Automated determination of image acquisition locations in building interiors using multiple data capture devices
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Patent Primary Examiner
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Charles L Beard
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CPC Code
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G01P 13/00
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G06T 11/203
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G06F 30/27
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G06T 2210/12
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G06F 30/13
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G06T 2210/04
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Patent abstract

Introduced here computer programs and associated computer-implemented techniques for generating measurements of physical structures and environments in an automated matter through analysis of data that is generated by one or more sensors included in a computing device. This can be accomplished by combining insights that are derived through analysis different types of data that are generated, computed, or otherwise obtained by a computing device. For instance, a computer program may enable or facilitate measurement of arbitrary dimensions, angles, and square footage of a physical structure based on (i) images generated by an image sensor included in the corresponding computing device and (ii) measurements generated by an inertial sensor included in the corresponding computing device.

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