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US Patent 11873482 Methods, compositions, and systems for spatial analysis of analytes in a biological sample

Patent 11873482 was granted and assigned to 10X Genomics on January, 2024 by the United States Patent and Trademark Office.

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
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Current Assignee
10X Genomics
10X Genomics
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Date Filed
April 27, 2023
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Date of Patent
January 16, 2024
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Patent Applicant
10X Genomics
10X Genomics
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Patent Application Number
18140312
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Patent Citations
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US Patent 6875572 Nucleic acid detection assays
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US Patent 6890741 Multiplexed detection of analytes
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US Patent 6897023 Method for determining relative abundance of nucleic acid sequences
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US Patent 6913881 Methods and compositions for detecting target sequences
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US Patent 6942968 Array compositions for improved signal detection
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US Patent 7011944 Invasive cleavage of nucleic acids
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US Patent 7057026 Labelled nucleotides
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US Patent 7083980 Tn5 transposase mutants and the use thereof
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US Patent 7098041 Methods to view and analyze the results from diffraction-based diagnostics
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US Patent 7115400 Methods of nucleic acid amplification and sequencing
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•••
Patent Citations Received
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US Patent 12110541 Methods for preparing high-resolution spatial arrays
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US Patent 12129516 Quantitative and automated permeabilization performance evaluation for spatial transcriptomics
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US Patent 11952627 Methods for identifying a location of an RNA in a biological sample
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US Patent 11965213 Methods of detecting spatial heterogeneity of a biological sample
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US Patent 11970739 Multiplex capture of gene and protein expression from a biological sample
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US Patent 11981958 Methods for spatial analysis using DNA capture
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US Patent 11981960 Spatial analysis utilizing degradable hydrogels
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US Patent 12071655 Methods, compositions, kits, and systems for enhancing analyte capture for spatial analysis
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US Patent 12076701 Capturing oligonucleotides in spatial transcriptomics
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Patent Inventor Names
David Sukovich
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Lauren Gutgesell
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Layla Katiraee
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Seayar Mohabbat
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Augusto Manuel Tentori
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Hanyoup Kim
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Janine Hensel
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
11873482
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Patent Primary Examiner
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Christopher M Gross
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