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US Patent 11871906 Endoscope system

Patent 11871906 was granted and assigned to Olympus Group on January, 2024 by the United States Patent and Trademark Office.

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Contents

Is a
Patent
Patent
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Patent attributes

Patent Applicant
Olympus Group
Olympus Group
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Current Assignee
Olympus Group
Olympus Group
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
118719060
Patent Inventor Names
Koji Matsumoto0
Date of Patent
January 16, 2024
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Patent Application Number
171082050
Date Filed
December 1, 2020
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Patent Citations
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US Patent 11045081 Endoscope system
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US Patent 11070739 Endoscope system having a first light source for imaging a subject at different depths and a second light source having a wide band visible band
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US Patent 7519096 Process and apparatus for a wavelength tuning source
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US Patent 8570625 Device and method for generating an image of an object
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US Patent 10251530 Scope sensing in a light controlled environment
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US Patent 10342459 Endoscope apparatus and measuring method
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US Patent 10972675 Endoscope system
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Patent Primary Examiner
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Aaron B Fairchild
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CPC Code
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A61B 1/000094
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A61B 1/0605
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A61B 1/0638
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A61B 1/00006
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Patent abstract

An endoscope system includes: an illumination portion that includes a light source and that is configured to radiate an illumination light beam having a spatially nonuniform intensity distribution onto an imaging subject; a first imager and a second imager disposed at positions that are different from each other and configured to respectively acquire a first illumination image and a second illumination image of the imaging subject being illuminated with the illumination light beam; and at least one processor configured to: create a first deep-layer image and a first surface-layer image from the first illumination image and create a second deep-layer image and a second surface-layer image from the second illumination image; and create a combined deep-layer image by combining the first deep-layer image and the second deep-layer image on the basis of pixel values of the first and second surface-layer images.

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