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US Patent 11858042 Open loop parameter optimization for additive manufacturing

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Contents

Is a
Patent
Patent
0

Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
118580420
Patent Inventor Names
Jeffrey L. Riemann0
Kurt Moran0
Michael Juhasz0
Date of Patent
January 2, 2024
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Patent Application Number
174108980
Date Filed
August 24, 2021
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Patent Citations
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US Patent 10421267 Method to monitor additive manufacturing process for detection and in-situ correction of defects
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US Patent 10252335 Accurate three-dimensional printing
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US Patent 10753955 Systems and method for advanced additive manufacturing
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US Patent 8809780 Electron beam layer manufacturing using scanning electron monitored closed loop control
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US Patent 10112262 System and methods for real-time enhancement of build parameters of a component
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Patent Primary Examiner
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Michael J. Brown
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CPC Code
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B22F 12/41
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B22F 12/90
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B22F 2203/11
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B33Y 10/00
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B33Y 50/02
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B22F 10/368
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B22F 10/366
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B22F 10/25
0
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Patent abstract

Certain aspects of the present disclosure provide a method for optimizing process parameters for additive manufacturing, including: determining a change to at least one process parameter of a plurality of process parameters while additively manufacturing a first part using an additive manufacturing apparatus according to a build file comprising machine code defining the plurality of process parameters; modifying the build file based on the determined change to the at least one process parameter to generate a modified build file; additively manufacturing a second part using the additive manufacturing apparatus according to the modified build file, wherein: additively manufacturing the first part is performed in a closed-loop control mode, and additively manufacturing the second part is performed in an open-loop control mode.

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