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US Patent 11759885 Methods and systems for operating a machine in a manufacturing process

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
Date Filed
December 19, 2019
Date of Patent
September 19, 2023
Patent Application Number
17312688
Patent Citations
‌
US Patent 9235205 Method for producing a measurement probe path on a numerically controlled machine tool
‌
US Patent 9399264 Electron beam layer manufacturing
Patent Inventor Names
Jose Juan Gabilondo
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
11759885
Patent Primary Examiner
‌
Thomas C. Lee
CPC Code
‌
G05B 2219/35134
‌
G05B 2219/45165
‌
G05B 2219/49353
‌
G05B 2219/49371
‌
Y02P 90/02
‌
G05B 19/4097
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B23K 26/0626

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