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US Patent 11759885 Methods and systems for operating a machine in a manufacturing process
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Patent
Date Filed
December 19, 2019
Date of Patent
September 19, 2023
Patent Application Number
17312688
Patent Citations
US Patent 9235205 Method for producing a measurement probe path on a numerically controlled machine tool
US Patent 9399264 Electron beam layer manufacturing
Patent Inventor Names
Jose Juan Gabilondo
Patent Jurisdiction
United States Patent and Trademark Office
Patent Number
11759885
Patent Primary Examiner
Thomas C. Lee
CPC Code
G05B 2219/35134
G05B 2219/45165
G05B 2219/49353
G05B 2219/49371
Y02P 90/02
G05B 19/4097
B23K 26/0626
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