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US Patent 11664213 Bevel edge removal methods, tools, and systems

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Is a
Patent
Patent
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Patent attributes

Patent Applicant
Taiwan Semiconductor Manufacturing Company
Taiwan Semiconductor Manufacturing Company
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Current Assignee
Taiwan Semiconductor Manufacturing Company
Taiwan Semiconductor Manufacturing Company
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
116642130
Date of Patent
May 30, 2023
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Patent Application Number
167275330
Date Filed
December 26, 2019
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Patent Citations
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US Patent 9146469 Middle layer composition for trilayer patterning stack
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US Patent 9213234 Photosensitive material and method of lithography
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US Patent 9223220 Photo resist baking in lithography process
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US Patent 9256133 Apparatus and method for developing process
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US Patent 9548303 FinFET devices with unique fin shape and the fabrication thereof
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US Patent 10857649 Method and apparatus for performing a polishing process in semiconductor fabrication
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US Patent 10073347 Semiconductor method of protecting wafer from bevel contamination
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US Patent 7979942 Substrate treatment apparatus and substrate treatment method
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...
Patent Primary Examiner
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Alexander Markoff
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CPC Code
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H01L 21/67219
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H01L 21/67046
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H01L 21/304
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H01L 21/30625
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A46B 13/04
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A46B 2200/30
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B08B 1/002
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H01L 21/02087
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...

A tool and methods of removing films from bevel regions of wafers are disclosed. The bevel film removal tool includes an inner motor nested within an outer motor and a bevel brush secured to the outer motor. The bevel brush is adjustable radially outward to allow the wafer to be inserted in the bevel brush and to be secured to the inner motor. The bevel brush is adjustable radially inward to engage one or more sections of the bevel brush and to bring the bevel brush in contact with a bevel region of the wafer. Once engaged, a solution may be dispensed at the engaged sections of the bevel brush and the inner motor and the outer motor may be rotated such that the bevel brush is rotated against the wafer such that the bevel films of the wafer are both chemically and mechanically removed.

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