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US Patent 11630208 Measurement system, measurement method, and measurement program

Patent 11630208 was granted and assigned to Topcon on April, 2023 by the United States Patent and Trademark Office.

OverviewStructured DataIssuesContributors
Is a
Patent
Patent
0
Current Assignee
Topcon
Topcon
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Date Filed
May 13, 2020
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Date of Patent
April 18, 2023
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Patent Applicant
Topcon
Topcon
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Patent Application Number
15930462
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Patent Citations
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US Patent 11035667 Monitoring system and method for controlling process of surface treatment for construction
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US Patent 11035955 Registration calculation of three-dimensional scanner data performed between scans based on measurements by two-dimensional scanner
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US Patent 11184967 Angularly varying light emitting device with an imager
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US Patent 11181639 Measurement device, measurement method, and control program for measurement device
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US Patent 10504294 System and method for augmented reality discrepancy determination and reporting
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US Patent 10613200 Scanning lidar system and method
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US Patent 10767991 Laser scanner
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US Patent 10809360 Laser scanner
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US Patent 10816939 Method of illuminating an environment using an angularly varying light emitting device and an imager
Patent Inventor Names
Tetsuji Anai
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Nobuyuki Nishita
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
11630208
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Patent Primary Examiner
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Nam V Nguyen
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CPC Code
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G01S 17/86
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G01C 15/002
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G01S 7/4817
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G01S 17/89
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G01S 7/51
0
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G01S 17/42
0

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