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US Patent 11508736 Method for forming different types of devices

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Is a
Patent
Patent
0

Patent attributes

Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
0
Patent Number
115087360
Patent Inventor Names
Feng-Ching Chu0
Yen-Ming Chen0
Wei-Yang Lee0
Feng-Cheng Yang0
Date of Patent
November 22, 2022
0
Patent Application Number
168956780
Date Filed
June 8, 2020
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Patent Citations
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US Patent 10157799 Multi-gate device and method of fabrication thereof
0
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US Patent 10290546 Threshold voltage adjustment for a gate-all-around semiconductor structure
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US Patent 10199502 Structure of S/D contact and method of making same
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US Patent 10475902 Spacers for nanowire-based integrated circuit device and method of fabricating same
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US Patent 10032627 Method for forming stacked nanowire transistors
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US Patent 10109721 Horizontal gate-all-around device having wrapped-around source and drain
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Patent Primary Examiner
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Dao H Nguyen
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CPC Code
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H01L 29/0673
0
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H01L 29/0847
0
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H01L 29/1037
0
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H01L 29/42392
0
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H01L 29/6653
0
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H01L 29/66545
0
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H01L 29/66553
0
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H01L 21/30604
0
...

A semiconductor device according to the present disclosure includes a gate-all-around (GAA) transistor in a first device area and a fin-type field effect transistor (FinFET) in a second device area. The GAA transistor includes a plurality of vertically stacked channel members and a first gate structure over and around the plurality of vertically stacked channel members. The FinFET includes a fin-shaped channel member and a second gate structure over the fin-shaped channel member. The fin-shaped channel member includes semiconductor layers interleaved by sacrificial layers.

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