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US Patent 11473992 Residual pressure measurement system for Fabry-Perot cavity of optical MEMS pressure sensor and method thereof

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Patent Applicant
Tianjin University
Tianjin University
Current Assignee
Tianjin University
Tianjin University
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
11473992
Date of Patent
October 18, 2022
Patent Application Number
16641738
Date Filed
April 23, 2018
Patent Primary Examiner
‌
Peter J Macchiarolo

The present invention discloses a residual pressure measurement system for a MEMS pressure sensor with an F-P cavity and method thereof, the measurement system includes a low-coherence light source, a 3 dB coupler, a MEMS pressure sensor, an air pressure chamber, a thermostat, a pressure control system, a cavity length demodulator, an acquisition card and a computer. The measurement method comprises: performing cavity length measurement by using the reflecting light by the pressure control system at two temperatures, respectively, so as to calibrate the MEMS pressure sensor and establish a relationship between the absolute phase of a monochromatic frequency and the external pressure; performing linear fitting to the two measurement data to obtain all the external pressure when the cavity length of two measurement data are equal to each other, and substituting the theoretical equation for calculation to obtain the residual pressure under the flat condition of the diaphragm.

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