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US Patent 11181639 Measurement device, measurement method, and control program for measurement device

Patent 11181639 was granted and assigned to Topcon on November, 2021 by the United States Patent and Trademark Office.

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Patent
Patent
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Patent attributes

Patent Applicant
Topcon
Topcon
0
Current Assignee
Topcon
Topcon
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
111816390
Patent Inventor Names
Yasushi Tanaka0
Hideki Morita0
Ken'ichiro Yoshino0
Date of Patent
November 23, 2021
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Patent Application Number
159366280
Date Filed
March 27, 2018
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Patent Citations Received
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US Patent 11630208 Measurement system, measurement method, and measurement program
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Patent Primary Examiner
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James R Hulka
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Patent abstract

Provided is a measurement device or the like that expands a dynamic range easily and promptly as appropriate even when three-dimensional data or the like on some parts of a measurement target object is not acquirable, so that the data can be acquired. A measurement device includes a light source unit that sequentially emits a plurality of beams of distance measurement light to an identical target object, based on predetermined fixed output information, a light reception unit that receives reflected light, from the target object, based on which the measurement device acquires measurement information, and an output value reducing unit and/or an input value reducing unit, the output value reducing unit reducing an output value of the light source unit, the input value reducing unit reducing an input value of the reflected light to the light reception unit.

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