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US Patent 10909117 Multiple measurements aggregated at multiple levels of execution of a workload

Patent 10909117 was granted and assigned to Micro Focus Limited on February, 2021 by the United States Patent and Trademark Office.

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Patent
Patent

Patent attributes

Patent Applicant
Hewlett Packard Enterprise
Hewlett Packard Enterprise
Current Assignee
Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
Patent Number
10909117
Date of Patent
February 2, 2021
Patent Application Number
15034356
Date Filed
December 20, 2013
Patent Citations
‌
US Patent 10208580 System and method for detection of slide and rotation modes
‌
US Patent 10307060 Mesh network personal emergency response appliance
Patent Primary Examiner
‌
Jean M Corrielus
Patent abstract

Described herein are techniques for identifying a path in a workload that may be associated with a deviation. A workload may be associated with multiple measurements of a plurality of metrics generated during execution of the workload. The multiple measurements may be aggregated at multiple levels of execution. One or more measurements may be compared to one or more other measurements or estimates to determine whether there is a deviation from an expected correlation. If determined that there is a deviation, a path can be identified in the workload that may be associated with the deviation.

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