US Patent 10365088 Distributed measuring device and method for simultaneously measuring strain and temperature based on optical frequency domain reflection
Patent 10365088 was granted and assigned to Tianjin University on July, 2019 by the United States Patent and Trademark Office.
Is a
Current Assignee
Date Filed
October 27, 2016
Date of Patent
July 30, 2019
Patent Applicant
Patent Application Number
15567078
Patent Inventor Names
Yang Du
0
Tiegen Liu
0
Zhexi Xu
0
Zhenyang Ding
0
Di Yang
0
Junfeng Jiang
0
Kun Liu
0
Patent Jurisdiction
Patent Number
Patent Primary Examiner
Find more entities like US Patent 10365088 Distributed measuring device and method for simultaneously measuring strain and temperature based on optical frequency domain reflection
Use the Golden Query Tool to find similar entities by any field in the Knowledge Graph, including industry, location, and more.
By using this site, you agree to our Terms of Service.