US Patent 10365088 Distributed measuring device and method for simultaneously measuring strain and temperature based on optical frequency domain reflection
Patent 10365088 was granted and assigned to Tianjin University on July, 2019 by the United States Patent and Trademark Office.
Find more entities like US Patent 10365088 Distributed measuring device and method for simultaneously measuring strain and temperature based on optical frequency domain reflection
Use the Golden Query Tool to find similar entities by any field in the Knowledge Graph, including industry, location, and more.