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US Patent 11992935 Methods and apparatus for verifiable inspection operations

Patent 11992935 was granted and assigned to Gecko Robotics on May, 2024 by the United States Patent and Trademark Office.

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Contents

Is a
Patent
Patent
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Patent attributes

Patent Applicant
Gecko Robotics
Gecko Robotics
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Current Assignee
Gecko Robotics
Gecko Robotics
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
119929350
Patent Inventor Names
Edward A. Bryner0
Michael A. Binger0
Edwin H. Cho0
Kevin Y. Low0
Date of Patent
May 28, 2024
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Patent Application Number
177520590
Date Filed
May 24, 2022
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Patent Citations
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US Patent 7743660 System and method for automated inspection of large-scale part
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US Patent 7859655 Method involving a pointing instrument and a target object
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US Patent 8570629 Reciprocating laser scanning device
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US Patent 8833169 System and method for inspection of a part with dual multi-axis robotic devices
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US Patent 8943892 Automated inspection of spar web in hollow monolithic structure
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US Patent 9121817 Ultrasonic testing device having an adjustable water column
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US Patent 9221506 Location tracking and motion control of automated marking device
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US Patent 9285296 Systems and methods for stand-off inspection of aircraft structures
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Patent Primary Examiner
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Dale Moyer
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CPC Code
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Y10S 901/01
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B25J 5/007
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B25J 9/0009
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B25J 9/1653
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B25J 9/1694
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B25J 13/087
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B25J 19/027
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G01N 29/265
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Patent abstract

Methods and apparatus for verifiable inspection operations are described. An example apparatus may have an inspection description circuit to interpret an inspection definition value and a payload status circuit to provide a payload identification value in response to at least one of a payload specific configuration or signals from a payload. The example apparatus may also have an inspection integrity circuit to determine an inspection description value in response to the inspection definition value and the payload identification value and an inspection reporting circuit to communicate the inspection description value to an external device.

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