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US Patent 11428619 Detecting nanoparticles on production equipment and surfaces

Patent 11428619 was granted and assigned to Particle Measuring Systems on August, 2022 by the United States Patent and Trademark Office.

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Contents

Is a
Patent
Patent
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Patent attributes

Patent Applicant
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Particle Measuring Systems
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Current Assignee
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Particle Measuring Systems
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Patent Jurisdiction
United States Patent and Trademark Office
United States Patent and Trademark Office
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Patent Number
114286190
Patent Inventor Names
Brian A. Knollenberg0
Daniel Robert Rodier0
Date of Patent
August 30, 2022
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Patent Application Number
171535730
Date Filed
January 20, 2021
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Patent Citations
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US Patent 10792694 Condensation apparatus
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US Patent 10371620 Automatic power control liquid particle counter with flow and bubble detection systems
0
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US Patent 10928293 Detecting nanoparticles on production equipment and surfaces
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US Patent 10908059 Slurry monitor coupling bulk size distribution and single particle detection
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US Patent 10859487 Automatic power control liquid particle counter with flow and bubble detection systems
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US Patent 10197487 Systems and methods for isolating condensate in a condensation particle counter
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US Patent 10345200 Microbial air sampler integrating media plate and sample collection device
Patent Citations Received
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US Patent 11781965 System and method for particles measurement
Patent Primary Examiner
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Jamil Ahmed
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CPC Code
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G01N 2015/0038
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B82Y 35/00
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G01N 21/05
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G01N 15/065
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Provided herein is a particle analyzer that is operably connected to a probe unit that is capable of both dislodging particles from a surface and sampling the particles after they have been dislodged. The devices and methods described herein may be lightweight and/or handheld, for example, so that they may be used within a cleanroom environment to clean and sample permanent surfaces and tools. The devices may include optical particle counters that use scattered, obscured or emitted light to detect particles, including condensation particle counting systems or split detection optical particle counters to increase the sensitivity of the device and thereby facilitate detection of smaller particles, while avoiding the increased complexity typically required for the detection of nanoscale particles, such as particles less than 100 nm in effective diameter.

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