List of Omniprobe patents

Patents where

Current Assignee

Name

Omniprobe

Name	Description	Patent Applicant	Current Assignee	Patent Jurisdiction	Patent Number	Date of Patent
‌ US Patent 7208724 Apparatus and method of detecting probe tip contact with a surface	Patent 7208724 was granted and assigned to Omniprobe on April, 2007 by the United States Patent and Trademark Office.		Omniprobe	United States Patent and Trademark Office	7208724	April 24, 2007
‌ US Patent 8394454 Method and apparatus for precursor delivery system for irradiation beam instruments	Patent 8394454 was granted and assigned to Omniprobe on March, 2013 by the United States Patent and Trademark Office.		Omniprobe	United States Patent and Trademark Office	8394454	March 12, 2013
‌ US Patent 7644637 Method and apparatus for transfer of samples in a controlled environment	Patent 7644637 was granted and assigned to Omniprobe on January, 2010 by the United States Patent and Trademark Office.		Omniprobe	United States Patent and Trademark Office	7644637	January 12, 2010
‌ US Patent 7395727 Strain detection for automated nano-manipulation	Patent 7395727 was granted and assigned to Omniprobe on July, 2008 by the United States Patent and Trademark Office.		Omniprobe	United States Patent and Trademark Office	7395727	July 8, 2008
‌ US Patent 8247768 Method for stem sample inspection in a charged particle beam instrument	Patent 8247768 was granted and assigned to Omniprobe on August, 2012 by the United States Patent and Trademark Office.		Omniprobe	United States Patent and Trademark Office	8247768	August 21, 2012
‌ US Patent 7315023 Method of preparing a sample for examination in a TEM	Patent 7315023 was granted and assigned to Omniprobe on January, 2008 by the United States Patent and Trademark Office.		Omniprobe	United States Patent and Trademark Office	7315023	January 1, 2008
‌ US Patent 7414252 Method and apparatus for the automated process of in-situ lift-out	Patent 7414252 was granted and assigned to Omniprobe on August, 2008 by the United States Patent and Trademark Office.		Omniprobe	United States Patent and Trademark Office	7414252	August 19, 2008
‌ US Patent 7381971 Method and apparatus for in-situ probe tip replacement inside a charged particle beam microscope	Patent 7381971 was granted and assigned to Omniprobe on June, 2008 by the United States Patent and Trademark Office.		Omniprobe	United States Patent and Trademark Office	7381971	June 3, 2008
‌ US Patent 7115882 TEM sample holder	Patent 7115882 was granted and assigned to Omniprobe on October, 2006 by the United States Patent and Trademark Office.		Omniprobe	United States Patent and Trademark Office	7115882	October 3, 2006
‌ US Patent RE46350 Method for stem sample inspection in a charged particle beam instrument	Patent RE46350 was granted and assigned to Omniprobe on March, 2017 by the United States Patent and Trademark Office.	Omniprobe	Omniprobe	United States Patent and Trademark Office	RE46350	March 28, 2017
‌ US Patent 7834315 Method for STEM sample inspection in a charged particle beam instrument	Patent 7834315 was granted and assigned to Omniprobe on November, 2010 by the United States Patent and Trademark Office.		Omniprobe	United States Patent and Trademark Office	7834315	November 16, 2010
‌ US Patent 8168949 Method for stem sample inspection in a charged particle beam instrument	Patent 8168949 was granted and assigned to Omniprobe on May, 2012 by the United States Patent and Trademark Office.		Omniprobe	United States Patent and Trademark Office	8168949	May 1, 2012
‌ US Patent 9349573 Total release method for sample extraction in an energetic-beam instrument	Patent 9349573 was granted and assigned to Omniprobe on May, 2016 by the United States Patent and Trademark Office.		Omniprobe	United States Patent and Trademark Office	9349573	May 24, 2016
‌ US Patent 7935937 Method of forming TEM sample holder	Patent 7935937 was granted and assigned to Omniprobe on May, 2011 by the United States Patent and Trademark Office.		Omniprobe	United States Patent and Trademark Office	7935937	May 3, 2011
‌ US Patent 7755372 Method for automated stress testing of flip-chip packages	Patent 7755372 was granted and assigned to Omniprobe on July, 2010 by the United States Patent and Trademark Office.		Omniprobe	United States Patent and Trademark Office	7755372	July 13, 2010
‌ US Patent 9097625 Gas injection system for energetic-beam instruments	Patent 9097625 was granted and assigned to Omniprobe on August, 2015 by the United States Patent and Trademark Office.	Omniprobe	Omniprobe	United States Patent and Trademark Office	9097625	August 4, 2015
‌ US Patent 8054558 Multiple magnification optical system with single objective lens	Patent 8054558 was granted and assigned to Omniprobe on November, 2011 by the United States Patent and Trademark Office.		Omniprobe	United States Patent and Trademark Office	8054558	November 8, 2011
‌ US Patent 7446542 Apparatus and method for automated stress testing of flip-chip packages	Patent 7446542 was granted and assigned to Omniprobe on November, 2008 by the United States Patent and Trademark Office.		Omniprobe	United States Patent and Trademark Office	7446542	November 4, 2008
‌ US Patent 7126132 Apparatus for preparing a TEM sample holder	Patent 7126132 was granted and assigned to Omniprobe on October, 2006 by the United States Patent and Trademark Office.		Omniprobe	United States Patent and Trademark Office	7126132	October 24, 2006
‌ US Patent 8759765 Method for processing samples held by a nanomanipulator	Patent 8759765 was granted and assigned to Omniprobe on June, 2014 by the United States Patent and Trademark Office.		Omniprobe	United States Patent and Trademark Office	8759765	June 24, 2014
‌ US Patent 7126133 Kit for preparing a tem sample holder	Patent 7126133 was granted and assigned to Omniprobe on October, 2006 by the United States Patent and Trademark Office.		Omniprobe	United States Patent and Trademark Office	7126133	October 24, 2006
‌ US Patent 8288740 Method for preparing specimens for atom probe analysis and specimen assemblies made thereby	Patent 8288740 was granted and assigned to Omniprobe on October, 2012 by the United States Patent and Trademark Office.		Omniprobe	United States Patent and Trademark Office	8288740	October 16, 2012
‌ US Patent 8440969 Method and apparatus for acquiring simultaneous and overlapping optical and charged particle beam images	Patent 8440969 was granted and assigned to Omniprobe on May, 2013 by the United States Patent and Trademark Office.		Omniprobe	United States Patent and Trademark Office	8440969	May 14, 2013
‌ US Patent 7961397 Single-channel optical processing system for energetic-beam microscopes	Patent 7961397 was granted and assigned to Omniprobe on June, 2011 by the United States Patent and Trademark Office.		Omniprobe	United States Patent and Trademark Office	7961397	June 14, 2011
‌ US Patent 8512474 Apparatus for precursor delivery system for irradiation beam instruments	Patent 8512474 was granted and assigned to Omniprobe on August, 2013 by the United States Patent and Trademark Office.		Omniprobe	United States Patent and Trademark Office	8512474	August 20, 2013

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